Advancements in structured illumination and computational imaging are revolutionizing semiconductor wafer inspection, ...

Samsung Electronics Co. Ltd. has successfully completed its evaluation of KLA-Tencor Corp.'s 2350 ultraviolet (UV) high-resolution imaging wafer inspection tool for use in monitoring the production of ...

November 24, 2013. Rudolph Technologies has announced that it has won orders for its AWX FSI unpatterned wafer inspection system at both a major Southeast Asia-based outsourced assembly and test (OSAT ...

August Technology Corp. today introduced the AXi series of automated wafer inspection tools designed to be utilized in front end wafer fabs detecting defects 0.5 microns in size and larger “The AXi's ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...