A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden within two-dimensional thin films, which are considered key materials for ...

A team of physicists at the University of Cambridge has unveiled a breakthrough in quantum sensing by demonstrating the use of spin defects in hexagonal boron nitride (hBN) as powerful, ...

Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...

Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a sensitivity approximately 1,000 times higher than that of existing techniques.

Researchers developed a daylight electroluminescence imaging method that enables detection of low-energy glass cracks in PV modules using motion-enhanced SWIR drone imaging. The approach allows ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate ...

Within the context of semiconductor inspection and failure analysis, latent defects present a significant challenge because they make it difficult to determine whether a fault originated during ...