Global warming and a progressively drier climate in many parts of the world are causing more dust storms. To predict how these storms are caused, researchers are looking into the past to understand ...

Many displays found in smartphones and televisions rely on thin-film transistors (TFTs) made from indium gallium zinc oxide (IGZO) to control pixels. IGZO offers high transparency due to its large ...

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot ...

Quantum engineers have spent years trying to tame the fragility of qubits, only to be thwarted by the tiniest imperfections in the materials they use. Now a new line of research flips that problem on ...

A new hybrid layered perovskite featuring elusive spontaneous defect ordering has been found, report scientists. By introducing specific concentrations of thiocyanate ions into FAPbI3 (FA = ...

Electron diffraction is a powerful analytical technique used to study the atomic structure of materials. It involves the interaction of a beam of electrons with a crystalline sample, resulting in a ...

Researchers at Università Cattolica, Brescia campus, have discovered that the transition from insulating to conductive behavior in certain materials is driven by topological defects in the structure.

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Insights into atomic-scale defects may enable next-generation thin-film transistors for smartphones, televisions, and flexible electronics. (Nanowerk News) Many displays found in smartphones and ...

Perovskites are among the most extensively studied materials in modern materials science. Their often unique and exotic properties, which stem from perovskite’s peculiar crystal structure, could find ...